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Details
| Topologie | Leistungsfaktor-Korrektur |
| Eingangsspannung | 24 V |
| Ausgang 1 | 40 V |
| IC-Revision | 1.0 |
Beschreibung
It is a low voltage digital power factor corrector evaluation board to be used with a compatible NUCLEO board from STMicroelectronics.This board implements a high performance but fully digital PFC pre-regulator power stage in the form of a single phase CCM ToTem Pole, or a dual-phase/interleaved CCM ToTem Pole. It is implementing the GAN technology transistors, from STMicroelectronics, and supporting high switching frequency.This board aims for demonstration and training purpose of this new topology.
Eigenschaften
- Continuous Conduction Mode (CCM) Power Factor Correction (PFC) power stage
- Single or two-phases interleaved ToTem Pole converter operation
- 24 Vac nominal input voltage
- 0-40 Vdc maximum output voltage
- Max power 16W (using on board load)
- On-board resistive loads (25% + 25% + 50%)
- Injection points for measurement of the voltage loop and current loop using a vector network analyzer
- Numerous Tests Points for measurements such as ISRs duration, PWMs signalisation, Input and Output voltages, Input current in each Legs , ZCD, etc.
- Compatible with the STM32G474RT6 nucleo board
Typische Anwendungen
- Demonstration and training purposes
Weiterführende Informationen
Artikeldaten
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|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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| Muster |
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| Artikel Nr. | Datenblatt | Simulation | Downloads | Status | Produktserie | Anwendung | PCB/Kabel/Panel | Modularity | λDom typ. (nm) | Farbe | λPeak typ. (nm) | IV typ. (mcd) | VF typ. (V) | Chiptechnologie | 2θ50% typ. (°) | C | Tol. C | VR (V (DC)) | Bauform | Betriebstemperatur | Qmin. | DF (%) | RISO | Keramiktyp | L (mm) | W (mm) | Fl (mm) | Montageart | IR 1 (mA) | Arbeitsspannung (V (AC)) | Betriebstemperatur | Q (%) | Package | Input | VCE max. (V) | Testbedingung CTR | CTR min. (%) | CTR max. (%) | VISO (V (RMS)) | Vin (V) | Vout (V) | Iout (A) | Pin Position | Endurance (h) | IRIPPLE (mA) | ILeak (µA) | Raster (mm) | Ø D (mm) | Z @ 100 MHz (Ω) | Zmax (Ω) | Testbedingung Zmax | IR 2 (mA) | RDC max. (Ω) | Typ | L (µH) | IR (A) | Pins (pcs) | Reihen | H (mm) | G (mm) | Gender | Verpackung | Muster |
|---|
