|
|
2.5/5G Base-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
2.5/5G Base-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
200 µH
|
–
|
|
Design Kit
–
|
|
|
|
2.5/5G Base-T, 1, 4PPoE (up to 1500 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
2.5/5G Base-T
|
Ports
1
|
PoE
4PPoE (up to 1500 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
120 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100BASE-TX, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-TX
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
0 °C up to +70 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100BASE-TX, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-TX
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
|
|
|
|
10/100BASE-TX, 1, PoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-TX
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100BASE-TX, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-TX
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +125 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
|
|
|
|
10G Base-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
0 °C up to +70 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
200 µH
|
–
|
|
Design Kit
–
|
|
|
|
10G Base-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
0 °C up to +70 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
200 µH
|
–
|
|
|
|
|
|
10/100BASE-TX, 1, PoE+ (up to 720 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-TX
|
Ports
1
|
PoE
PoE+ (up to 720 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
120 µH
|
–
|
|
|
|
|
|
10G Base-T, 1, PoE+ (up to 600 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
PoE+ (up to 600 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
0 °C up to +70 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
120 µH
|
–
|
|
|
|
|
|
10G Base-T, 1, PoE+ (up to 1 A)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
PoE+ (up to 1 A)
|
Improved Common Mode Rejection
No
|
Operating Temperature
0 °C up to +70 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
180 µH
|
–
|
|
|
|
|
|
10G Base-T, 1, PoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
0 °C up to +70 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
120 µH
|
–
|
|
|
|
|
|
10G Base-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
120 µH
|
–
|
|
Design Kit
–
|
|
|
|
10G Base-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
120 µH
|
–
|
|
Design Kit
–
|
|
|
|
10G Base-T, 1, PoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
0 °C up to +70 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
200 µH
|
–
|
|
Design Kit
–
|
|
|
|
10G Base-T, 1, PoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
200 µH
|
–
|
|
Design Kit
–
|
|
|
|
10G Base-T, 1, PoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
120 µH
|
–
|
|
Design Kit
–
|
|
|
|
10G Base-T, 1, PoE+ (up to 600 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
PoE+ (up to 600 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
0 up to +70 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
120 µH
|
–
|
|
Design Kit
–
|
|
|
|
10G Base-T, 1, PoE+ (up to 1 A)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
PoE+ (up to 1 A)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
120 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100/1000BASE-T, 1, 4PPoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100/1000BASE-T
|
Ports
1
|
PoE
4PPoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100/1000BASE-T, 1, 4PPoE (up to 600 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100/1000BASE-T
|
Ports
1
|
PoE
4PPoE (up to 600 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100/1000BASE-T, 1, 4PPoE (up to 1000 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100/1000BASE-T
|
Ports
1
|
PoE
4PPoE (up to 1000 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100/1000BASE-T, 0.5, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100/1000BASE-T
|
Ports
0.5
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100/1000BASE-T, 1, 4PPoE (up to 800 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100/1000BASE-T
|
Ports
1
|
PoE
4PPoE (up to 800 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100/1000BASE-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100BASE-TX, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-TX
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
0 °C up to +70 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100BASE-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
4500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100BASE-T, 1, PoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-T
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
4500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100/1000BASE-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100/1000BASE-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10G Base-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
180 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100BASE-TX, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-TX
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
2500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100/1000 Base-T, 10/100 Base-T1
|
–
|
–
|
–
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T, 1000 Base-T1
|
–
|
–
|
–
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
120 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100BASE-T, 1, PoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-T
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
4000 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100BASE-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100BASE-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100BASE-T, 1, PoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-T
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
4000 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100BASE-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100BASE-T, 1, PoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-T
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
4000 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100/1000BASE-T, 1, PoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100/1000BASE-T
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-T
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
180 µH
|
–
|
|
Design Kit
–
|
|
|
|
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100BASE-T
|
Ports
1
|
PoE
PoE+ (up to 720 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
150 µH
|
–
|
|
Design Kit
–
|
|
|
|
10/100/1000BASE-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100/1000BASE-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100/1G/10GBase-T
|
–
|
PoE
PoE (up to 350 mA)
|
–
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
110 µH
|
–
|
|
Design Kit
–
|
|
|
|
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100/1GBase-T
|
–
|
PoE
PoE (up to 350 mA)
|
–
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10/100/1G/10GBase-T
|
–
|
PoE
PoE+ (up to 600 mA)
|
–
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
110 µH
|
–
|
|
Design Kit
–
|
|
|
|
10G Base-T, 1, PoE (up to 350 mA)
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
10G Base-T
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
4000 V (RMS)
|
Mount
SMT
|
Inductance
120 µH
|
–
|
|
Design Kit
–
|
|
|
|
1000 Base-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000 Base-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
|
|
|
|
1000 Base-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000 Base-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
Yes
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
|
|
|
|
1000 Base-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000 Base-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
0 °C up to +70 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
|
|
|
|
1000 Base-T, 1, PoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000 Base-T
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
0 °C up to +70 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
|
|
|
|
1000 Base-T, 1, 4PPoE (up to 1500 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000 Base-T
|
Ports
1
|
PoE
4PPoE (up to 1500 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
180 µH
|
–
|
|
Design Kit
–
|
|
|
|
1000 Base-T, 2, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000 Base-T
|
Ports
2
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
1000 Base-T, 1, 4PPoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000 Base-T
|
Ports
1
|
PoE
4PPoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
4000 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
1000BASE-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000BASE-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
1000 Base-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000 Base-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
1000 Base-T, 1, 4PPoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000 Base-T
|
Ports
1
|
PoE
4PPoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
4000 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
1000 Base-T, 1, 4PPoE (up to 350 mA)
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000 Base-T
|
Ports
1
|
PoE
4PPoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
4000 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
1000 Base-T, 1, non-PoE
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000 Base-T
|
Ports
1
|
PoE
non-PoE
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
4000 V (RMS)
|
Mount
SMT
|
Inductance
350 µH
|
–
|
|
Design Kit
–
|
|
|
|
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000 Base-T
|
Ports
1
|
PoE
PoE (up to 350 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
180 µH
|
–
|
|
Design Kit
–
|
|
|
|
|
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
1000 Base-T
|
Ports
1
|
PoE
PoE+ (up to 720 mA)
|
Improved Common Mode Rejection
No
|
Operating Temperature
-40 °C up to +85 °C
|
Insulation Test Voltage
1500 V (RMS)
|
Mount
SMT
|
Inductance
150 µH
|
–
|
|
Design Kit
–
|
|
|
|
BMS, 1, –
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
BMS
|
Ports
1
|
–
|
–
|
Operating Temperature
-40 °C up to +125 °C
|
–
|
Mount
SMT
|
Inductance
450 µH
|
–
|
|
Design Kit
–
|
|
|
|
BMS, 1, –
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
BMS
|
Ports
1
|
–
|
–
|
Operating Temperature
-40 °C up to +125 °C
|
–
|
Mount
SMT
|
Inductance
450 µH
|
–
|
|
Design Kit
–
|
|
|
|
BMS, 1, –
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
BMS
|
Ports
1
|
–
|
–
|
Operating Temperature
-40 °C up to +125 °C
|
–
|
Mount
SMT
|
Inductance
450 µH
|
–
|
|
Design Kit
–
|
|
|
|
BMS, 2, –
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
BMS
|
Ports
2
|
–
|
–
|
Operating Temperature
-40 °C up to +125 °C
|
–
|
Mount
SMT
|
Inductance
450 µH
|
–
|
|
Design Kit
–
|
|
|
|
BMS, 2, –
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
BMS
|
Ports
2
|
–
|
–
|
Operating Temperature
-40 °C up to +125 °C
|
–
|
Mount
SMT
|
Inductance
450 µH
|
–
|
|
Design Kit
–
|
|
|
|
BMS, 2, –
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
BMS
|
Ports
2
|
–
|
–
|
Operating Temperature
-40 °C up to +125 °C
|
–
|
Mount
SMT
|
Inductance
450 µH
|
–
|
|
Design Kit
–
|
|
|
|
BMS, 2, –
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
BMS
|
Ports
2
|
–
|
–
|
Operating Temperature
-40 °C up to +125 °C
|
–
|
Mount
SMT
|
Inductance
450 µH
|
–
|
|
Design Kit
–
|
|
|
|
BMS, 2, –
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
BMS
|
Ports
2
|
–
|
–
|
Operating Temperature
-40 °C up to +125 °C
|
–
|
Mount
SMT
|
Inductance
450 µH
|
–
|
|
Design Kit
–
|
|
|
|
BMS, 1, –
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
Data rate
BMS
|
Ports
1
|
–
|
–
|
Operating Temperature
-40 °C up to +125 °C
|
–
|
Mount
SMT
|
Inductance
450 µH
|
–
|
|
Design Kit
–
|
|
|
|
–, –, –
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
–
|
–
|
–
|
–
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
400 V (RMS)
|
–
|
Inductance
300 µH
|
–
|
|
Design Kit
–
|
|
|
|
–, –, –
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
–
|
–
|
–
|
–
|
Operating Temperature
-40 °C up to +105 °C
|
Insulation Test Voltage
400 V (RMS)
|
–
|
Inductance
2000 µH
|
–
|
|
Design Kit
–
|
|
|
|
–, 1, –
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
–
|
Ports
1
|
–
|
–
|
Operating Temperature
-40 °C up to +125 °C
|
Insulation Test Voltage
4500 V (RMS)
|
Mount
SMT
|
Inductance
20 µH
|
–
|
|
Design Kit
–
|
|
|
|
–, 1, –
|
Simulation
–
|
|
Status
Active
i
| Production is active. Expected lifetime: >10 years.
|
–
|
Ports
1
|
–
|
–
|
Operating Temperature
-40 °C up to +125 °C
|
Insulation Test Voltage
4500 V (RMS)
|
Mount
SMT
|
Inductance
20 µH
|
–
|
|
Design Kit
–
|
|
|
|
–, –, –
|
Simulation
–
|
|
Status
New
i
| Product is new in our portfolio and production is active. Expected lifetime: >10 years.
|
–
|
–
|
–
|
–
|
Operating Temperature
-40 °C up to +125 °C
|
Insulation Test Voltage
2250 V (RMS)
|
Mount
SMT
|
Inductance
2200 µH
|
Interwinding Capacitance
18 pF
|
|
Design Kit
–
|
|
|
|
–, –, –
|
Simulation
–
|
|
Status
New
i
| Product is new in our portfolio and production is active. Expected lifetime: >10 years.
|
–
|
–
|
–
|
–
|
Operating Temperature
-40 °C up to +125 °C
|
Insulation Test Voltage
2250 V (RMS)
|
Mount
SMT
|
Inductance
2200 µH
|
Interwinding Capacitance
18 pF
|
|
Design Kit
–
|
|