IC-Hersteller Silicon Laboratory Inc.

IC-Hersteller (103)

Silicon Laboratory Inc. EFR32BG27 | Demoboard xG27-DK2602A

EFR32xG27 Development Kit

Details

TopologieUSB
Eingangsspannung5 V
IC-RevisionA02

Beschreibung

The EFR32xG27 Dev Kit (xG27-DK2602A) is a compact, feature-packed development platform. It provides the fastest path to develop and prototype wireless IoT products. The development platform supports up to +8 dBm output power and includes support for the 16-bit ADC as well as other key features.

Eigenschaften

Based on EFR32BG27C140F768IM40 2.4 GHz Wireless SoC,+8 dBm, 768 kB Flash, 64 kB RAM, 5x5 QFN40Integrated on-chip antennaSecure Vault™ MidOn-board sensors: temperature sensor, humidity sensor, 6-axis inertial sensor, 2 x digital microphones, ambient light sensor, hall effect sensorUser LED / pushbuttonsQwiic Connector: For compatibility with Sparkfun's expansion hardware (sensors, camera, LCD, etc.)USB Port: Board Power, Serial CommunicationOn-board Debugger: SWD, VCOM, and Packet Trace Interface (PTI)Probe points for power measurementsCR2032 coin cell battery support

Typische Anwendungen

  • Portable Medical
  • Home End Devices
  • Fleet/Asset Monitoring
  • Sports, Fitness, and Wellness devices
  • Bluetooth Mesh
  • Power Tools
  • Access Control
  • Industrial Automation

Weiterführende Informationen

Artikeldaten

Artikel Nr. Daten­blatt Simu­lation Downloads Status ProduktserieIR
(mA)
RDC
(Ω)
Z @ 100 MHz
(Ω)
Zmax
(Ω)
Testbedingung ZmaxIR 2
(mA)
Testbedingung IR 2Z @ 1 GHz
(Ω)
Typ Muster
742692004SPEC
10 Dateien Aktiv i| Produktion ist aktiv. Erwartete Lebenszeit: >10 Jahre.WE-TMSB SMT-Ferrit 200 240 460 536 MHz 300 ΔT = 40 K 342 Breitband
782853231SPEC
8 Dateien Aktiv i| Produktion ist aktiv. Erwartete Lebenszeit: >10 Jahre.WE-CBA SMT EMI Suppression Ferrite Bead 3000 0.05 220 330 300 MHz High Current
Artikel Nr. Daten­blatt Simu­lation
742692004SPEC
782853231SPEC
Muster
Artikel Nr. Daten­blatt Simu­lation Downloads Status ProduktserieIR
(mA)
RDC
(Ω)
Z @ 100 MHz
(Ω)
Zmax
(Ω)
Testbedingung ZmaxIR 2
(mA)
Testbedingung IR 2Z @ 1 GHz
(Ω)
Typ Muster