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Analog Devices ADuM4177 | Demoboard EVAL-ADuM4177EBZ
40 A Source and 30 A Sink, SiC Isolated Gate Driver with Slew-Rate Control and BISTs
Overview
| Topology | Other Topology |
Description
The EVAL-ADuM4177EBZ evaluation board shows the advanced features of the ADuM4177 while maintaining flexibility in a testing environment. The EVAL ADuM4177EBZ evaluation board layout delivers a circuit that is easy to control through jumper pins andwith access to all of the pins through headers and input and output connectors. A more optimized layout is possible that increases the performance of the system.
Features
- 40 A (source), 30 A (sink) peak drive output capability
- Output power device resistance: 0.38 Ω per MOSFET
- Test infrastructure for
- SPI communication
- Slew-rate control
- Desaturation detection
- Miller drive
- Active short-circuit
- Temperature sensing
- Fault reporting
- Multiple dummy loads
Typical applications
- Electric vehicles (EV) and hybrid electric vehicles (HEV) traction inverters
- SiC, MOSFET, IGBT gate drivers, Industrial inverters , Power factor correctors
- Switching power supplies