 | | 1:1:1, 25.2 µVs, 1500 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:1:1 | Voltage-µSecond25.2 µVs | Insulation Test Voltage1500 V (DC) | Interwinding Capacitance9 pF | Leakage Inductance1.7 µH | SizeEP5 | | Reference Design – | |
| | 1:1, 30.2 µVs, 1500 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:1 | Voltage-µSecond30.2 µVs | Insulation Test Voltage1500 V (DC) | Interwinding Capacitance10 pF | Leakage Inductance1.8 µH | SizeEP5 | | Reference Design – | |
| | 1.5:1, 40.8 µVs, 1500 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1.5:1 | Voltage-µSecond40.8 µVs | Insulation Test Voltage1500 V (DC) | Interwinding Capacitance9 pF | Leakage Inductance2.9 µH | SizeEP5 | | Reference Design – | |
 | | 1:1:1, 102 µVs, 2500 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:1:1 | Voltage-µSecond102 µVs | Insulation Test Voltage2500 V (DC) | Interwinding Capacitance11 pF | Leakage Inductance4 µH | SizeEP7 | | Reference Design – | |
| | 1:1, 102 µVs, 2500 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:1 | Voltage-µSecond102 µVs | Insulation Test Voltage2500 V (DC) | Interwinding Capacitance11 pF | Leakage Inductance4 µH | SizeEP7 | | Reference Design – | |
| | 1.5:1:1, 99 µVs, 2500 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1.5:1:1 | Voltage-µSecond99 µVs | Insulation Test Voltage2500 V (DC) | Interwinding Capacitance11 pF | Leakage Inductance3.5 µH | SizeEP7 | | Reference Design – | |
 | | 1:1:5:5, 28 µVs, 2100 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:1:5:5 | Voltage-µSecond28 µVs | Insulation Test Voltage2100 V (DC) | Interwinding Capacitance90 pF | Leakage Inductance0.4 µH | Size1210 | | Reference Design – | |
| | 1:1:2:2, 70 µVs, 2100 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:1:2:2 | Voltage-µSecond70 µVs | Insulation Test Voltage2100 V (DC) | Interwinding Capacitance100 pF | Leakage Inductance1.5 µH | Size1210 | | Reference Design – | |
 | | 1:1.2, –, 4000 V (DC) | | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:1.2 | – | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance8.2 pF | Leakage Inductance0.7 µH | SizeEP7 | | | |
| | 1:2, –, 4000 V (DC) | | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:2 | – | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance6.8 pF | Leakage Inductance0.55 µH | SizeEP7 | | | |
| | 1:2, –, 4000 V (DC) | | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:2 | – | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance6.8 pF | Leakage Inductance0.5 µH | SizeEP7 | | | |
| | 1:1.67, 36 µVs, 4000 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:1.67 | Voltage-µSecond36 µVs | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance0.68 pF | Leakage Inductance0.55 µH | SizeEP7 | | | |
| | 1.56:3.89:1:1:1, –, 4000 V (DC) | | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1.56:3.89:1:1:1 | – | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance6.4 pF | Leakage Inductance1 µH | SizeEP7 | | | |
| | 1:1, 60 µVs, 4000 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:1 | Voltage-µSecond60 µVs | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance1.3 pF | Leakage Inductance1.5 µH | SizeEP7 | | | |
| | 1.2:2:1, –, 4000 V (DC) | | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1.2:2:1 | – | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance3.25 pF | Leakage Inductance0.24 µH | SizeEP7 | | | |
| | 1:2, 72 µVs, 4000 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:2 | Voltage-µSecond72 µVs | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance2.1 pF | Leakage Inductance3 µH | SizeEP7 | | Reference Design – | |
| | 1.8:3.6:1, –, 4000 V (DC) | | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1.8:3.6:1 | – | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance7.3 pF | Leakage Inductance0.5 µH | SizeEP7 | | | |
| | 1:1.57, 40 µVs, 4000 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:1.57 | Voltage-µSecond40 µVs | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance2 pF | Leakage Inductance0.85 µH | SizeEP7 | | | |
| | 1.83:1, 64 µVs, 4000 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1.83:1 | Voltage-µSecond64 µVs | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance2 pF | Leakage Inductance1.9 µH | SizeEP7 | | | |
| | 1.2:1, 70 µVs, 4000 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1.2:1 | Voltage-µSecond70 µVs | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance2 pF | Leakage Inductance2.2 µH | SizeEP7 | | | |
| | 1:1.08, 70 µVs, 4000 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:1.08 | Voltage-µSecond70 µVs | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance2.6 pF | Leakage Inductance2.25 µH | SizeEP7 | | | |
| | 1:1.29, 40 µVs, 4000 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:1.29 | Voltage-µSecond40 µVs | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance2.1 pF | Leakage Inductance0.755 µH | SizeEP7 | | | |
 | | 1:1, 28.7 µVs, 2000 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio1:1 | Voltage-µSecond28.7 µVs | Insulation Test Voltage2000 V (DC) | Interwinding Capacitance12 pF | Leakage Inductance1.4 µH | SizeER9.5/5 | | Reference Design – | |
| | 2.5:1:1, 29.4 µVs, 1500 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio2.5:1:1 | Voltage-µSecond29.4 µVs | Insulation Test Voltage1500 V (DC) | Interwinding Capacitance7 pF | Leakage Inductance2.3 µH | SizeEP5 | | Reference Design – | |
| | 2:1:1, 28.6 µVs, 1500 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio2:1:1 | Voltage-µSecond28.6 µVs | Insulation Test Voltage1500 V (DC) | Interwinding Capacitance7 pF | Leakage Inductance1.9 µH | SizeEP5 | | Reference Design – | |
| | 2.5:1, 33.6 µVs, 1500 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio2.5:1 | Voltage-µSecond33.6 µVs | Insulation Test Voltage1500 V (DC) | Interwinding Capacitance9 pF | Leakage Inductance2.3 µH | SizeEP5 | | Reference Design – | |
| | 2:1:1, 102 µVs, 2500 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio2:1:1 | Voltage-µSecond102 µVs | Insulation Test Voltage2500 V (DC) | Interwinding Capacitance11 pF | Leakage Inductance4 µH | SizeEP7 | | Reference Design – | |
| | 2.5:1:1, 120 µVs, 2500 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio2.5:1:1 | Voltage-µSecond120 µVs | Insulation Test Voltage2500 V (DC) | Interwinding Capacitance11 pF | Leakage Inductance5 µH | SizeEP7 | | Reference Design – | |
| | 2.25:3.5:1, –, 4000 V (DC) | | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio2.25:3.5:1 | – | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance7.5 pF | Leakage Inductance0.4 µH | SizeEP7 | | | |
| | 2.25:3.5:1, –, 4000 V (DC) | | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio2.25:3.5:1 | – | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance7 pF | Leakage Inductance0.6 µH | SizeEP7 | | | |
| | 2:2.86:1.43:1.43:1, –, 4000 V (DC) | | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio2:2.86:1.43:1.43:1 | – | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance7.8 pF | Leakage Inductance0.7 µH | SizeEP7 | | | |
| | 2.25:4.25:1, –, 4000 V (DC) | | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio2.25:4.25:1 | – | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance7.5 pF | Leakage Inductance0.5 µH | SizeEP7 | | | |
| | 2.2:1, 64 µVs, 4000 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio2.2:1 | Voltage-µSecond64 µVs | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance2 pF | Leakage Inductance1.9 µH | SizeEP7 | | | |
| | 3:1:1, 140 µVs, 2500 V (DC) | Simulation– | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio3:1:1 | Voltage-µSecond140 µVs | Insulation Test Voltage2500 V (DC) | Interwinding Capacitance11 pF | Leakage Inductance7.5 µH | SizeEP7 | | Reference Design – | |
| | 3.5:3.5:1, –, 4000 V (DC) | | | Status Activei| Production is active. Expected lifetime: >10 years. | Turns Ratio3.5:3.5:1 | – | Insulation Test Voltage4000 V (DC) | Interwinding Capacitance7 pF | Leakage Inductance0.6 µH | SizeEP7 | | | |
